Validity of Swanepoel's Method for Calculating the Optical Constants of Thick Films
- 1 March 2012
- journal article
- research article
- Published by Institute of Physics, Polish Academy of Sciences in Acta Physica Polonica A
- Vol. 121 (3), 628-635
- https://doi.org/10.12693/aphyspola.121.628
Abstract
Optical constants, dispersion and oscillator parameters of different thicknesses of amorphous Ce25Cd5Se70 films have been deposited onto glass substrates using thermal evaporation technique. The optical constants have been investigated by optical spectrophotometry measurements. The straight forward analysis proposed by Swanepoel, which is based on the use of the extremes of the interference fringes has been used in order to derive the refractive index and the film thickness in mu m range. The refractive index could be extrapolated by the Cauchy dispersion relationship over the whole spectral range, which extended from 400 to 2500 nm. It is observed that, refractive index n increases with the film thickness. The possible optical transition is found to be allowed indirect transition with energy gap increase from 1.915 to 1.975 eV with increasing film thickness. The dispersion of the refractive index is discussed in terms of the Wemple-DiDomenico single oscillator model. The interband oscillator wavelength, the average oscillator strength, and the optical conductivity were estimated for different thicknesses of amorphous Ge25Cd5Se70 films.This publication has 26 references indexed in Scilit:
- Optical spectroscopy, optical conductivity, dielectric properties and new methods for determining the gap states of CuSe thin filmsJournal of Alloys and Compounds, 2010
- Compositional dependence of the optical properties of amorphous antimony selenide thin films using transmission measurementsThin Solid Films, 2007
- Compositional dependence of the optical properties of amorphous semiconducting glass Ge10AsxSe(90−x) thin filmsJournal of Physics and Chemistry of Solids, 2007
- Method for determining the optical constants of thin dielectric films with variable thickness using only their shrunk reflection spectraJournal of Physics D: Applied Physics, 2001
- Catalyzed gelation of amorphous sulphidesJournal of Non-Crystalline Solids, 1999
- The Physics of Optical RecordingPublished by Springer Science and Business Media LLC ,1993
- Calculation of the optical constants of a thin layer upon a transparent substrate from the reflection spectrumJournal of Physics D: Applied Physics, 1989
- Determination of surface roughness and optical constants of inhomogeneous amorphous silicon filmsJournal of Physics E: Scientific Instruments, 1984
- Determination of the thickness and optical constants of amorphous siliconJournal of Physics E: Scientific Instruments, 1983
- A simple method for the determination of the optical constants n, k and the thickness of a weakly absorbing thin filmJournal of Physics E: Scientific Instruments, 1976