ELNES study of carbon K-edge spectra of plasma deposited carbon films
- 1 January 2004
- journal article
- research article
- Published by Royal Society of Chemistry (RSC) in Journal of Materials Chemistry
- Vol. 14 (13), 2030-2035
- https://doi.org/10.1039/b406468m
Abstract
Electron energy loss spectroscopy was used to investigate the bonding of plasma deposited carbon films. The experimental conditions include the use of a specific collection angle for which the shape of the spectra is free of the orientation dependency usually encountered in graphite due to its anisotropic structure. The first quantification process of the energy loss near-edge structure was performed by a standard fit of the collected spectrum, corrected for background and multiple scattering, with three Gaussian functions followed by a comparison with the graphite spectrum obtained under equivalent experimental conditions. In a second approach a fitting model directly incorporating the background subtraction and multiple scattering removal was applied. The final numerical results are interpreted in view of the deposition conditions of the films and the actual fitting procedure with the related choice of parameters.Keywords
This publication has 5 references indexed in Scilit:
- hybridization ratio in amorphous carbon from Ccore-level shifts: X-ray photoelectron spectroscopy and first-principles calculationPhysical Review B, 2001
- Density,fraction, and cross-sectional structure of amorphous carbon films determined by x-ray reflectivity and electron energy-loss spectroscopyPhysical Review B, 2000
- Orientation Sensitive EELS-analysis of Boron Nitride Nanometric Hollow SpheresMicron, 1998
- Tetrahedral bonding in amorphous carbonReports on Progress in Physics, 1996
- Structure and luminescence properties of an amorphous hydrogenated carbonPhilosophical Magazine Part B, 1996