Marked point process in image analysis
- 7 November 2002
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Signal Processing Magazine
- Vol. 19 (5), 77-84
- https://doi.org/10.1109/msp.2002.1028354
Abstract
In this article, we consider the marked point process framework for image analysis. We first show that marked point processes are more adapted than Markov random fields (MRFs) including some geometrical constraints in the solution and dealing with strongly correlated noise. Then, we consider three applications in remote sensing: road network extraction, building extraction, and image segmentation. For each of them, we define a prior model, incorporating geometrical constraints on the solution. We also derive a reversible jump Monte Carlo Markov chains (RJMCMC) algorithm to obtain the optimal solution with respect to the defined models. Results show that this approach is promising and can be applied to a broad range of image processing problems.Keywords
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