Intrinsic Ferroelectric Properties of Strained Tetragonal PbZr0.2Ti0.8O3 Obtained on Layer–by–Layer Grown, Defect–Free Single–Crystalline Films
- 8 June 2006
- journal article
- research article
- Published by Wiley in Advanced Materials
- Vol. 18 (13), 1657-1661
- https://doi.org/10.1002/adma.200502711
Abstract
No abstract availableKeywords
This publication has 37 references indexed in Scilit:
- Domain structure control of (001)∕(100)-oriented epitaxial Pb(Zr,Ti)O3 films grown on (100)cSrRuO3∕(100)SrTiO3 substratesApplied Physics Letters, 2005
- Spontaneous polarization change with Zr∕(Zr+Ti) ratios in perfectly polar-axis-orientated epitaxial tetragonal Pb(Zr,Ti)O3 filmsApplied Physics Letters, 2004
- Defect theory: elusive state-of-the-artMaterials Today, 2003
- Critical thickness for ferroelectricity in perovskite ultrathin filmsNature, 2003
- Theory of structural response to macroscopic electric fields in ferroelectric systemsPhysical Review B, 2002
- Defects in Semiconductors: Some Fatal, Some VitalScience, 1998
- POINT DEFECT CHEMISTRY OF METAL OXIDE HETEROSTRUCTURESAnnual Review of Materials Science, 1998
- Polarization as a Berry PhaseEurophysics News, 1997
- Electric polarization as a bulk quantity and its relation to surface chargePhysical Review B, 1993
- Thermodynamic theory of the lead zirconate-titanate solid solution system, part V: Theoretical calculationsFerroelectrics, 1989