Low-noise design criteria for detector readout systems in deep submicron CMOS technology
- 1 February 2002
- journal article
- Published by Elsevier BV in Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
- Vol. 478 (1), 362-366
- https://doi.org/10.1016/s0168-9002(01)01831-9
Abstract
No abstract availableKeywords
This publication has 3 references indexed in Scilit:
- Experimental studies of the noise properties of a deep submicron CMOS processNuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, 2001
- Noise characterization of a CMOS technology for the LHC experimentsNuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, 2001
- Layout techniques to enhance the radiation tolerance of standard CMOS technologies demonstrated on a pixel detector readout chipNuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, 1999