Studies on layer disorder, microstructural parameters and other properties of tungsten-substitued molybdenum disulfide, Mo1−xWxS2 (0≤x≤1)
- 30 October 1997
- journal article
- Published by Elsevier BV in Synthetic Metals
- Vol. 90 (2), 135-142
- https://doi.org/10.1016/s0379-6779(97)81262-3
Abstract
No abstract availableKeywords
This publication has 24 references indexed in Scilit:
- Synthesis and characterization of molybdenum-tungsten mixed sulphoselenide, Mo0.5W0.5S x Se2?x (0 ? x ? 2)Journal of Materials Science Letters, 1996
- Characterization and Activity of Unsupported Ni-Mo Sulfide Catalysts in HDN/HDS ReactionsEnergy & Fuels, 1994
- Properties of MoSe2 thin films obtained by solid state reactions between thin films and by d.c. diode sputteringMaterials Chemistry and Physics, 1994
- Crystal growth of C60 thin films on layered substratesApplied Physics Letters, 1993
- Preparation and characterization of molybdenum disulphide catalystsJournal of Materials Science, 1993
- High pressure synthesis and characterization of molybdenum disulphideJournal of the Less Common Metals, 1986
- Layer type tungsten dichalcogenide compounds: their preparation, structure, properties and usesJournal of Materials Science, 1985
- Indium intercalation compounds of molybdenum disulphide; InxMoS2 (0⩽ × ⩽1)Synthetic Metals, 1985
- Synthesis and characterization of indium intercalation compounds of tungsten disulphide: InxWS2 (0 ⩽ x ⩽ 1)Synthetic Metals, 1985
- High-pressure growth of polycrystalline molybdenum disulphideMaterials Letters, 1983