Concurrent off-phase built-in self-test of dormant logic
- 6 January 2003
- conference paper
- conference paper
- Published by Institute of Electrical and Electronics Engineers (IEEE) in International Test Conference 1988 Proceeding@m_New Frontiers in Testing
Abstract
No abstract availableKeywords
This publication has 5 references indexed in Scilit:
- Strongly code disjoint checkersIEEE Transactions on Computers, 1988
- Concurrent Error Detection in Multiply and Divide ArraysIEEE Transactions on Computers, 1983
- Design for testability—A surveyProceedings of the IEEE, 1983
- Concurrent Error Detection in ALU's by Recomputing with Shifted OperandsIEEE Transactions on Computers, 1982
- Fault Detection Capabilities of Alternating LogicIEEE Transactions on Computers, 1978