Direct evidence by positron annihilation spectroscopy of defect distributions deeper thanRpin Ar+implanted silica glass
- 14 May 2009
- journal article
- Published by IOP Publishing in Journal of Physics D: Applied Physics
- Vol. 42 (11)
- https://doi.org/10.1088/0022-3727/42/11/115418
Abstract
No abstract availableThis publication has 19 references indexed in Scilit:
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