Quantitative Determination of Organic Semiconductor Microstructure from the Molecular to Device Scale
- 9 August 2012
- journal article
- review article
- Published by American Chemical Society (ACS) in Chemical Reviews
- Vol. 112 (10), 5488-5519
- https://doi.org/10.1021/cr3001109
Abstract
No abstract availableKeywords
This publication has 100 references indexed in Scilit:
- Three-Dimensional Packing Structure and Electronic Properties of Biaxially Oriented Poly(2,5-bis(3-alkylthiophene-2-yl)thieno[3,2-b]thiophene) FilmsJournal of the American Chemical Society, 2012
- Molecular Packing of High-Mobility Diketo Pyrrolo-Pyrrole Polymer Semiconductors with Branched Alkyl Side ChainsJournal of the American Chemical Society, 2011
- Solvent‐Induced Morphology in Polymer‐Based Systems for Organic PhotovoltaicsAdvanced Functional Materials, 2011
- Effects of Thermal Annealing Upon the Nanomorphology of Poly(3‐hexylselenophene)‐PCBM BlendsMacromolecular Rapid Communications, 2011
- Versatile Use of Vertical‐Phase‐Separation‐Induced Bilayer Structures in Organic Thin‐Film TransistorsAdvanced Materials, 2008
- X‐ray Spectromicroscopy of Polymer/Fullerene Composites: Quantitative Chemical MappingSmall, 2006
- Band Structure of the Four Pentacene Polymorphs and Effect on the Hole Mobility at Low TemperatureThe Journal of Physical Chemistry B, 2005
- X-ray microscopy in polymer science: prospects of a ‘new’ imaging techniquePolymer, 1995
- X-Ray Interactions: Photoabsorption, Scattering, Transmission, and Reflection at E = 50-30,000 eV, Z = 1-92Atomic Data and Nuclear Data Tables, 1993
- Microparacrystals: The intermediate stage between crystalline and amorphousJournal of Materials Science, 1991