Variation of yield with thickness in SIMS and PDMS: Measurements of secondary ion emission from organized molecular films
- 1 February 1988
- journal article
- Published by Elsevier BV in Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
- Vol. 30 (1), 74-82
- https://doi.org/10.1016/0168-583x(88)90082-1
Abstract
No abstract availableThis publication has 34 references indexed in Scilit:
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