Diffusion mechanisms in the Pd/Au thin film system and the correlation of resistivity changes with Auger electron spectroscopy and Rutherford backscattering profiles
- 1 March 1976
- journal article
- Published by Elsevier BV in Thin Solid Films
- Vol. 33 (1), 107-134
- https://doi.org/10.1016/0040-6090(76)90592-7
Abstract
No abstract availableKeywords
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