Analysis of charge carrier multiplication events in NPT and PT-diodes triggered by an ionizing particle
- 25 May 2004
- conference paper
- conference paper
- Published by Institute of Electrical and Electronics Engineers (IEEE) in 2003 IEEE Conference on Electron Devices and Solid-State Circuits (IEEE Cat. No.03TH8668)
Abstract
No abstract availableThis publication has 3 references indexed in Scilit:
- Superfast fronts of impact ionization in initially unbiased layered semiconductor structuresJournal of Applied Physics, 2002
- Cosmic ray induced failures in high power semiconductor devicesMicroelectronics Reliability, 1997
- Ionization Rates for Electrons and Holes in SiliconPhysical Review B, 1958