Computational Method for Determining n and k for a Thin Film from the Measured Reflectance, Transmittance, and Film Thickness
- 1 January 1966
- journal article
- Published by Optica Publishing Group in Applied Optics
- Vol. 5 (1), 41-43
- https://doi.org/10.1364/ao.5.000041
Abstract
Optics InfoBase is the Optical Society's online library for flagship journals, partnered and copublished journals, and recent proceedings from OSA conferences.Keywords
This publication has 5 references indexed in Scilit:
- Precise Method for Measuring the Absolute Phase Change on ReflectionJournal of the Optical Society of America, 1964
- Optical Constants of Silicon in the Region 1 to 10 evPhysical Review B, 1960
- Precision Measurement of Absolute Specular Reflectance with Minimized Systematic ErrorsJournal of the Optical Society of America, 1960
- Multiple-Beam Fringes of Equal Chromatic Order Part IV Use of Multilayer FilmsJournal of the Optical Society of America, 1955
- Intrinsic Optical Absorption in Single-Crystal Germanium and Silicon at 77°K and 300°KPhysical Review B, 1955