Nanoscale Indentation of Polymer Systems Using the Atomic Force Microscope
- 1 August 1997
- journal article
- research article
- Published by Taylor & Francis Ltd in The Journal of Adhesion
- Vol. 64 (1), 31-59
- https://doi.org/10.1080/00218469708010531
Abstract
The use of the atomic force microscope (AFM) to measure surface forces has been developed to optimize its operation as a surface imaging tool. This capability can potentially be extended to evaluate nanoscale material response to indentation and would be ideal for the evaluation of multi-component polymer systems, such as adhesives and composites. In this paper, previous work related to the development of the AFM as a nanoindentation device is reviewed, and a technique is proposed which allows the AFM to be used to probe local stiffness changes in polymer systems. Cantilever probes with spring constants ranging from 0.4–150 N m were used to investigate a number of polymer systems, including an elastomer, several polyurethane systems, thermally cured epoxies, a thermoplastic polymer-thermosetting polymer adhesive system, and a thermoplastic matrix composite.Keywords
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