Distinction of the Two Phases of CuTCNQ by Scanning Electrochemical Microscopy
- 29 July 2005
- journal article
- Published by American Chemical Society (ACS) in Analytical Chemistry
- Vol. 77 (17), 5447-5452
- https://doi.org/10.1021/ac050172k
Abstract
The two known phases of CuTCNQ and TCNQ (TCNQ = 7,7‘,8,8‘-tetracyanoquinodimethane) have been probed by scanning electrochemical microscopy (SECM) in the feedback mode. The first use of this technique for distinguishing differences in the electronic properties of semiconductor phases exploits the large differences in conductivity that exist between CuTCNQ and the parent TCNQ material and also between the CuTCNQ phases I and II. However, the packing density of the individual CuTCNQ crystals in a film structure also is shown to influence the SECM feedback response. Finally, it is shown that films of pure phase II material or mixtures of the phases can be mapped using feedback mode SECM. The SECM method provides valuable insights for elucidating properties of semiconducting solids that are mounted on insulating substrates.Keywords
This publication has 20 references indexed in Scilit:
- Polymer field-effect transistors by a drawing methodApplied Physics Letters, 2004
- Phase, Morphology, and Particle Size Changes Associated with the Solid−Solid Electrochemical Interconversion of TCNQ and Semiconducting CuTCNQ (TCNQ = Tetracyanoquinodimethane)Chemistry of Materials, 2003
- Studying electron transfer at electrochromic tungsten oxide sol–gel films with scanning electrochemical microscopy (SECM)Physical Chemistry Chemical Physics, 2003
- Electroanalytical measurements using the scanning electrochemical microscopeAnalytica Chimica Acta, 2000
- Scanning electrochemical microscopy: beyond the solid/liquid interfaceAnalytica Chimica Acta, 1999
- Nanostructured organic materials: copper- and silver-TCNQ radical saltsNanostructured Materials, 1995
- Scanning Electrochemical Microscopy. 25. Application to Investigation of the Kinetics of Heterogeneous Electron Transfer at Semiconductor (WSe2 and Si) ElectrodesThe Journal of Physical Chemistry, 1994
- Electrochemical Studies of the Mechanism of the Formation of Metal‐TCNQ Charge‐Transfer Complex FilmJournal of the Electrochemical Society, 1993
- Characterization of Cu-CuTCNQ-M devices using scanning electron microscopy and scanning tunneling microscopyChemistry of Materials, 1993
- Hole injection and etching studies of gallium arsenide using the scanning electrochemical microscopeLangmuir, 1990