X-Ray Line Broadening in Calcium Fluoride

Abstract
X‐ray diffraction profiles of calcium fluoride show broadening which is partly caused by small crystallites and partly by deformation. Annealing eliminates most of the broadening and is accompanied by a parameter change that takes place between room temperature and 250°C and is probably associated with the precipitation of calcium oxide. By cold working the annealed calcium fluoride, it was possible to produce a specimen showing profile integral breadths equal to the original material, but which analysis showed to be caused almost entirely by strain.