Optical, Structural and Laser-Induced Damage Threshold Properties of HfO 2 Thin Films Prepared by Electron Beam Evaporation
- 14 April 2005
- journal article
- Published by IOP Publishing in Chinese Physics Letters
- Vol. 22 (5), 1246-1248
- https://doi.org/10.1088/0256-307x/22/5/062
Abstract
No abstract availableThis publication has 10 references indexed in Scilit:
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