Roughness Induced Backscattering in Optical Silicon Waveguides
- 20 January 2010
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review Letters
- Vol. 104 (3)
- https://doi.org/10.1103/physrevlett.104.033902
Abstract
We report on the direct observation of backscattering induced by sidewall roughness in high-index-contrast optical waveguides based on total internal reflection. Our results demonstrate that backscattering is one of the most severe limiting factors in state-of-the art silicon on insulator nanowires employed in densely integrated photonics. We also derive the general relationship between backscattering and geometrical and optical parameters of the waveguide. Further, the role of roughness in polarization rotation and coupling with higher-order modes is pointed out.Keywords
This publication has 13 references indexed in Scilit:
- Disorder-Induced Coherent Scattering in Slow-Light Photonic Crystal WaveguidesPhysical Review Letters, 2009
- Backscattering in monomode periodic waveguidesPhysical Review B, 2008
- Two Regimes of Slow-Light Losses Revealed by Adiabatic Reduction of Group VelocityPhysical Review Letters, 2008
- Fabrication of low-loss photonic wires in silicon-on-insulator using hydrogen silsesquioxane electron-beam resistElectronics Letters, 2008
- Direct Observation of Subluminal and Superluminal Velocity Swinging in Coupled Mode Optical PropagationPhysical Review Letters, 2007
- Roughness losses and volume-current methods in photonic-crystal waveguidesApplied Physics B Laser and Optics, 2005
- Extrinsic Optical Scattering Loss in Photonic Crystal Waveguides: Role of Fabrication Disorder and Photon Group VelocityPhysical Review Letters, 2005
- Measurement of depolarization ratio and ultimate limit of polarization crosstalk in silica-based waveguides by using a POLCRJournal of Lightwave Technology, 1998
- Surface roughness and backscatteringOptics Letters, 1996
- Mode Conversion Caused by Surface Imperfections of a Dielectric Slab WaveguideBell System Technical Journal, 1969