Neutron-induced 10B fission as a major source of soft errors in high density SRAMs
- 1 February 2001
- journal article
- Published by Elsevier BV in Microelectronics Reliability
- Vol. 41 (2), 211-218
- https://doi.org/10.1016/s0026-2714(00)00218-3
Abstract
No abstract availableKeywords
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