Turning liabilities into assets: Exploiting deep submicron CMOS technology to design secure embedded circuits
- 1 May 2008
- conference paper
- conference paper
- Published by Institute of Electrical and Electronics Engineers (IEEE)
- No. 02714302,p. 3178-3181
- https://doi.org/10.1109/iscas.2008.4542133
Abstract
This paper explores an unexpected link between system-level security considerations and deep-submicron CMOS circuits. Many deep-submicron effects including increased leakage power, process variability, noise-level, power- density and integration density are thought of to be liabilities for integrated design. However, we show how they may instead be an asset for certain types of secure circuits. These circuits are useful for secure embedded systems design, where stringent cost-, power- and implementation constraints, as well as the increased risk towards physical attacks, are among the design issues. We also conclude that not all deep sub-micron liabilities are secure-circuit assets, and point out some of the open challenges in secure circuit design.Keywords
This publication has 10 references indexed in Scilit:
- Trojan Detection using IC FingerprintingPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2007
- Cryptography on a Speck of DustComputer, 2007
- A Provably Secure True Random Number Generator with Built-In Tolerance to Active AttacksIEEE Transactions on Computers, 2006
- Trusted Computing for Disk Drives and Other PeripheralsIEEE Security & Privacy, 2006
- Research lessons from hardware hackingCommunications of the ACM, 2006
- Ultra-Efficient (Embedded) SOC Architectures based on Probabilistic CMOS (PCMOS) TechnologyPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2006
- Extracting secret keys from integrated circuitsIEEE Transactions on Very Large Scale Integration (VLSI) Systems, 2005
- Parameter variations and impact on circuits and microarchitecturePublished by Association for Computing Machinery (ACM) ,2003
- Design challenges of technology scalingIEEE Micro, 1999
- Conquering noise in deep-submicron digital ICsIEEE Design & Test of Computers, 1998