Waveguide mode imaging and dispersion analysis with terahertz near-field microscopy
- 27 April 2009
- journal article
- research article
- Published by AIP Publishing in Applied Physics Letters
- Vol. 94 (17), 171104
- https://doi.org/10.1063/1.3126053
Abstract
Propagation of terahertz waves in hollow metallic waveguides depends on the waveguide mode. Near-field scanning probe terahertz microscopy is applied to identify the mode structure and composition in dielectric-lined hollow metallic waveguides. Spatial profiles, relative amplitudes, and group velocities of three main waveguide modes are experimentally measured and matched to the HE 11 , HE 12 , and TE 11 modes. The combination of near-field microscopy with terahertz time-resolved spectroscopy opens the possibility of waveguide mode characterization in the terahertz band.This publication has 14 references indexed in Scilit:
- Hollow optical fibers loaded with an inner dielectric film for terahertz broadband spectroscopyJournal of the Optical Society of America B, 2008
- Low-loss modes in hollow metallic terahertz waveguides with dielectric coatingsApplied Physics Letters, 2008
- Fabrication of terahertz hollow-glass metallic waveguides with inner dielectric coatingsJournal of Applied Physics, 2008
- Silver/polystyrene-coated hollow glass waveguides for the transmission of terahertz radiationOptics Letters, 2007
- Hollow polycarbonate waveguides with inner Cu coatings for delivery of terahertz radiationOptics Express, 2004
- Terahertz pulse propagation through small aperturesApplied Physics Letters, 2001
- Collection-mode near-field imaging with 0.5-THz pulsesIEEE Journal of Selected Topics in Quantum Electronics, 2001
- Terahertz near-field microscopy based on a collection mode detectorApplied Physics Letters, 2000
- Terahertz waveguidesJournal of the Optical Society of America B, 2000
- Attenuation and Radiation Characteristics of the HE /Sub 11/ - ModeIEEE Transactions on Microwave Theory and Techniques, 1980