A 32 nm Embedded, Fully-Digital, Phase-Locked Low Dropout Regulator for Fine Grained Power Management in Digital Circuits
- 18 September 2014
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Journal of Solid-State Circuits
- Vol. 49 (11), 2684-2693
- https://doi.org/10.1109/jssc.2014.2353798
Abstract
The need for fine-grained power management in digital ICs has led to the design and implementation of compact, scalable low-drop out regulators (LDOs) embedded deep within logic blocks. While analog LDOs have traditionally been used in digital ICs, the need for digitally implementable LDOs embedded in digital functional units for ultrafine grained power management is paramount. This paper presents a fully-digital, phase locked LDO implemented in 32 nm CMOS. The control model of the proposed design has been provided and limits of stability have been shown. Measurement results with a resistive load as well as a digital load exhibit peak current efficiency of 98%.Keywords
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