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Effect of Strain-Rate Sensitivity on Scale Phenomena in Chip Formation
Home
Publications
Effect of Strain-Rate Sensitivity on Scale Phenomena in Chip Formation
Effect of Strain-Rate Sensitivity on Scale Phenomena in Chip Formation
JL
J. Larsen-Basse
J. Larsen-Basse
PO
P. L. B. Oxley
P. L. B. Oxley
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1 January 1973
conference paper
other
Published by
Springer Science and Business Media LLC
p.
209-216
https://doi.org/10.1007/978-1-349-01857-4_31
Abstract
No abstract available
Keywords
STRESS
DEPTH
MACHINING
CHIP
STRAIN RATE
FLOW
SHEAR
MOVING
PHENOMENA
PROPORTIONAL
Cited by 19 articles