On the Van der Pauw method of resistivity measurements
- 1 March 1994
- journal article
- Published by Elsevier BV in Thin Solid Films
- Vol. 239 (2), 272-275
- https://doi.org/10.1016/0040-6090(94)90863-x
Abstract
No abstract availableThis publication has 3 references indexed in Scilit:
- Dependence of resistivity and photoconductivity in evaporated cadmium sulphide thin films on deposition and annealing conditionsInternational Journal of Electronics, 1992
- Dependence of transport parameters on thickness in polycrystalline CdS thin filmsThin Solid Films, 1985
- Electrical properties of polycrystalline In-doped CdS thin filmsJournal of Physics D: Applied Physics, 1984