X-Ray Diffraction Residual Stress Techniques
Open Access
- 1 January 1986
- book chapter
- Published by ASM International
Abstract
Volume 10 addresses materials characterization from an engineering perspective, describing the capabilities and limitations of various analytical tools and what they reveal about the composition, structure, and state of engineering materials. It examines optical metallography, electron microscopy, diffraction, chromatography, spectroscopy, and chemical analysis. It also discusses sample requirements and imaging enhancement techniques and includes glossary and other reference information. For information on the print version of Volume 10, ISBN: 978-0-87170-016-2, follow this link.Keywords
This publication has 3 references indexed in Scilit:
- Residual stresses in ground steelsMetallurgical Transactions A, 1980
- The influence of multiaxial stress states, stress gradients and elastic anisotropy on the evaluation of (Residual) stresses by X-raysJournal of Applied Crystallography, 1979
- A Correction for the 1 2Doublet in the Measurement of Widths of X-ray Diffraction LinesJournal of Scientific Instruments, 1948