Tungstate polyoxometalates as active components of molecular devices
- 15 October 2005
- journal article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 98 (8)
- https://doi.org/10.1063/1.2103416
Abstract
No abstract availableKeywords
This publication has 12 references indexed in Scilit:
- Tunneling transport in polyoxometalate based composite materialsApplied Physics Letters, 2003
- Self-assembled multilayer films based on a Keggin-type polyoxometalate and polyanilineJournal of Colloid and Interface Science, 2003
- Transport properties of polyoxometalate containing polymeric materialsSynthetic Metals, 2003
- Comparison of the photoredox properties of polyoxometallates and semiconducting particlesChemical Society Reviews, 2000
- Formation of a Self-Assembled Monolayer of Diaminododecane and a Heteropolyacid Monolayer on the ITO SurfaceLangmuir, 1999
- Electron transport through a metal-molecule-metal junctionPhysical Review B, 1999
- Measurement of tunneling current through Al/polyimide Langmuir–Blodgett film/Al structureJournal of Applied Physics, 1994
- Micropatterned Films of Tungsten Nuclei for Subsequent Metallization Formed of a Phosphotungstic Acid‐Based Negative ResistJournal of the Electrochemical Society, 1992
- Polyoxometalate Chemistry: An Old Field with New Dimensions in Several DisciplinesAngewandte Chemie-International Edition, 1991
- Generalized Formula for the Electric Tunnel Effect between Similar Electrodes Separated by a Thin Insulating FilmJournal of Applied Physics, 1963