Avalanche breakdown of high-voltage p-n junctions of SiC
- 29 February 1996
- journal article
- Published by Elsevier BV in Microelectronics Journal
- Vol. 27 (1), 43-51
- https://doi.org/10.1016/0026-2692(95)00056-9
Abstract
No abstract availableThis publication has 20 references indexed in Scilit:
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