Fourier transform infrared characterization of nanometre
- 7 December 1998
- journal article
- Published by IOP Publishing in Journal of Physics: Condensed Matter
- Vol. 10 (48), 11121-11127
- https://doi.org/10.1088/0953-8984/10/48/031
Abstract
Fourier transform infrared transmission and reflectance spectra of nanometer with particle sizes ranging from 4 to 80 nm have been recorded at room temperature. The results show that even in very small sizes (4-8 nm), the grains retain the main features of rutile structure. Two surface modes at 640 and 520 without specific symmetries have been identified. The peak at 550 manifests the lattice imperfections in bigger nanometre samples. The present results indicate that the FT-IR technique is more sensitive than Raman scattering in the characterization of the transformation from nano-grains to polycrystalline.Keywords
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