Scanning X-ray microdiffraction with submicrometer white beam for strain/stress and orientation mapping in thin films
- 27 February 2003
- journal article
- research article
- Published by International Union of Crystallography (IUCr) in Journal of Synchrotron Radiation
- Vol. 10 (2), 137-143
- https://doi.org/10.1107/s0909049502021362