How to determine the limits of usingAf nfunction for extraction of ITO cell contribution to dielectric spectra?

Abstract

The “classical” way to estimate and extract the high frequency indium tin oxide (ITO) cell contribution to dielectric losses is to use a special shape of frequency function: [R. Dhar, An impedance model to improve the higher frequency limit of electrical measurements on the capacitor made from electrodes of finite resistances, Indian J. Pure Appl. Phys. 42 (2004), pp. 56–61; M.B. Pandey, R. Dhar, and R. Dąbrowski, Dielectric spectroscopy of a newly synthesized chlorinated analogue of MHPOBC antiferroelectric liquid crystals, Ferroelectrics 343 (2006), pp. 83–100]. This article explains why such a shape for estimating function is used and determines how fast relaxation can be investigated using this method. The shape can be derived from the model presented in [P. Perkowski Dielectric spectroscopy of liquid crystals. Theoretical model of ITO electrodes influence on dielectric measurements, Opto-Electron. Rev. 17 (2009), pp. 180–186]. This function can yield accurate results rather for slow relaxations investigated in ITO cells.