Frequency dependence of soft error rates for sub-micron CMOS technologies
- 13 November 2002
- conference paper
- conference paper
- Published by Institute of Electrical and Electronics Engineers (IEEE)
Abstract
No abstract availableKeywords
This publication has 5 references indexed in Scilit:
- Static noise margin and soft-error rate simulations for thin film transistor cell stability in a 4 Mbit SRAM designPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2002
- Analysis of single-event effects in combinational logic-simulation of the AM2901 bitslice processorIEEE Transactions on Nuclear Science, 2000
- Comparison of error rates in combinational and sequential logicIEEE Transactions on Nuclear Science, 1997
- Cosmic ray neutron-induced soft errors in sub-half micron CMOS circuitsIEEE Electron Device Letters, 1997
- A new failure mode of radiation-induced soft errors in dynamic memoriesIEEE Electron Device Letters, 1988