Universal Test Sets for Logic Networks
- 1 September 1973
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Computers
- Vol. C-22 (9), 835-839
- https://doi.org/10.1109/tc.1973.5009174
Abstract
This paper examines the problem of finding a single universal test set that will test any of a variety of different implementations of a given switching function. It is shown that, for AND/OR networks, universal test sets may be found that detect not only all single faults but all multiple faults as well. The minimality and size of these sets are examined and their derivation for incomplete functions is described.Keywords
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