Stability problems in point contact solar cells
- 1 January 1988
- conference paper
- conference paper
- Published by Institute of Electrical and Electronics Engineers (IEEE)
- p. 423-428 vol.1
- https://doi.org/10.1109/pvsc.1988.105736
Abstract
Single-crystal silicon point-contact solar cells show a degradation in their efficiency after being exposed to concentrated sunlight. Two mechanisms appear to be responsible: an increase in surface recombination velocity caused by ultraviolet light, possibly due to electron injection from the silicon into the oxide, and a gradual lowering of the effective carrier lifetime that occurs when the cell is under high-level injection for an extended period of time. Point-contact solar cells whose front-side passivation has a phosphorus as well as a thermal oxide diffusion are dramatically more resistant to ultraviolet radiation damage. Modeling results indicate that it is possible to make a point-contact solar cell that is 26.8% efficient after massive ultraviolet exposure.Keywords
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