Rankings
Publications
Sources
Publishers
Scholars
Organizations
About
Login
Register
Home
Publications
Effect of Pre-Existing Defects on Reliability Assessment of High-K Gate Dielectrics
Home
Publications
Effect of Pre-Existing Defects on Reliability Assessment of High-K Gate Dielectrics
Effect of Pre-Existing Defects on Reliability Assessment of High-K Gate Dielectrics
Publisher Website
Google Scholar
Cite
Download
Share
Download
1 September 2004
journal article
Published by
Elsevier BV
in
Microelectronics Reliability
Vol. 44
(9)
,
1509-1512
https://doi.org/10.1016/j.microrel.2004.07.048
Abstract
No abstract available
Keywords
K GATE
HIGH K
GATE DIELECTRICS
EXISTING DEFECTS
PRE EXISTING
RELIABILITY ASSESSMENT
EFFECT OF PRE
Cited by 58 articles