Fast analysis of gases in the submillimeter∕terahertz with “absolute” specificity
- 5 April 2005
- journal article
- research article
- Published by AIP Publishing in Applied Physics Letters
- Vol. 86 (15), 154105
- https://doi.org/10.1063/1.1897442
Abstract
A submillimeter∕terahertz point detector for gas monitoring and quantification is described. It is based upon the fast ( ∼ 15 GHz ∕ s ) sweeping of high spectral purity ( < 1 ∕ 10 7 ) , high brightness ( ∼ 10 14 K ) microwave sources and a scanning electronic reference for frequency measurement. This approach can quantify the complex rotational spectrum of gases at a rate of ∼ 10 5 spectral resolution elements∕second at high signal to noise. This resolution and the uniqueness of Doppler limited rotational spectra provide “absolute” specificity and “zero” false alarm rates even in complex mixtures. Moreover, the small size, low power consumption, and the potential of very low cost make this approach attractive for a number of important applications.Keywords
This publication has 36 references indexed in Scilit:
- Noise, detectors, and submillimeter–terahertz system performance in nonambient environmentsJournal of the Optical Society of America B, 2004
- Applications and Outlook for Electronic Terahertz TechnologyOptics and Photonics News, 2003
- Photoacoustic trace gas detection of ethane using a continuously tunable, continuous-wave optical parametric oscillator based on periodically poled lithium niobateApplied Physics Letters, 2002
- Gas-absorption spectroscopy with electronic terahertz techniquesIEEE Transactions on Microwave Theory and Techniques, 2000
- A fast scan submillimeter spectroscopic techniqueReview of Scientific Instruments, 1997
- Far-infrared terahertz time-domain spectroscopy of flamesOptics Letters, 1995
- Spectroscopy in the terahertz regionVibrational Spectroscopy, 1995
- Millimeter- and submillimeter-wave spectrum of highly excited states of waterThe Astrophysical Journal, 1991
- Gas Analysis by Computer-Controlled Microwave Rotational SpectrometryApplied Spectroscopy, 1978
- Extension of Microwave Absorption Spectroscopy to 0.37-mm WavelengthPhysical Review Letters, 1970