Direct Evidence for Random-Alloy Splitting of Cu Levels inGaAs1xPx

Abstract
A splitting of the Cu-related 1.36-eV luminescence in GaAs into a set of lines in the GaAs1xPx alloy system is interpreted in a model with only the nearest-neighbor group-V shell influencing the defect levels. Experiental peak intensities are in good agreement with simple calculations and the binding energies of the defects are found to follow calculated chemical trends for defect pairs. Results for the ternary alloys are extrapolated to and compared with the case of Cu in GaP.