Nontraditional test methods being developed in response to the demand for quality parts in short development times are described. The need for a complete economic model that includes the time-to-market and quality costs associated with testing along with the usual test pattern generation and test hardware costs is discussed. The limitations of current approaches are identified, and three new methods-scan (in a variety of forms), built-in-self-test, and massive observability-are examined, and their advantages and drawbacks are considered.