Beam scanning using microstrip line on biased ferrite
- 1 January 1997
- journal article
- Published by Institution of Engineering and Technology (IET) in Electronics Letters
- Vol. 33 (8), 645-646
- https://doi.org/10.1049/el:19970459
Abstract
The beam scanning properties of a 2-element patch array fed by a microstrip feed situated on a ferrite substrate are presented. Biasing the ferrite changes the phase length of the microstrip line, scanning the beam by up to 40°. The resulting scan loss is ~2 dB, mainly due to the ferrite becoming lossy as it approaches absorption resonance.Keywords
This publication has 3 references indexed in Scilit:
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