Bolometer with thermosensitive layer made of vanadium oxide VO x
- 1 May 2012
- journal article
- Published by Pleiades Publishing Ltd in Nanotechnologies in Russia
- Vol. 7 (5-6), 227-237
- https://doi.org/10.1134/s1995078012030111
Abstract
The electrical parameters of the thermosensitive layer of VO x bolometer and the morphology of its surface have been studied. The relative measurement error caused by the VO x oxide layer has been determined. Calculated and experimental data on the heating of the VO x layer by 1 and 200°C in the wavelength ranges 0.5–3.39 μm and 5.0–12 μm are given as a function of pulse duration in the range of 1–10−9 s on various substrates. The time constant and voltaic sensitivity of the bolometer have been analyzed as a function of the size of the receiving pad and substrate material. The bolometer time constant, voltaic sensitivity, and equivalent voltage values of fundamental noise were calculate as a function of sizes of the receiving pad, substrate material, and frequency of recorded radiation. The values of specific heat flow and bolometer detectivity at frequencies of 1, 10, and 20 Hz measured on various dielectric substrates are presented. The bolometer modular design consists of a sealed housing with a receiver and resistance-to-voltage converter. Voltage values from the bolometer output are presented as a function of the acting constant and pulse radiation.Keywords
This publication has 2 references indexed in Scilit:
- Recording of laser irradiation by reversible film media on the basis of vanadium dioxideNanotechnologies in Russia, 2011
- Vanadium oxide films with improved characteristics for ir microbolometric matricesTechnical Physics Letters, 2001