Structure and transformation of the metastable boron- and oxygen-related defect center in crystalline silicon
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- 22 January 2004
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review B
- Vol. 69 (2), 024107
- https://doi.org/10.1103/physrevb.69.024107
Abstract
We analyze the core structure of the carrier-lifetime-reducing boron- and oxygen-related metastable defect center in crystalline silicon by measuring the correlation of the defect concentration with the boron and the oxygen contents on a large number of different silicon materials. The experimental results indicate that the defect is composed of one substitutional boron and two interstitial oxygen atoms. Formation and annihilation of the metastable boron-oxygen complex are found to be thermally activated processes, characterized by two strongly differing activation energies. Measurements of the defect generation rate as a function of light intensity show that the defect generation rate increases proportionally with light intensity below 1 and saturates at higher intensities. All experimental results can be consistently explained using a defect reaction model based on fast-diffusing oxygen dimers which are captured by substitutional boron to form a metastable complex. Based on this model, new strategies for an effective reduction of the light degradation of solar cells made on oxygen-rich silicon materials are derived. The model also explains why no lifetime degradation is observed in aluminum-, gallium-, and indium-doped oxygen-rich silicon.
Keywords
This publication has 17 references indexed in Scilit:
- Effect of illumination conditions on Czochralski-grown silicon solar cell degradationJournal of Applied Physics, 2003
- Oxygen-related minority-carrier trapping centers in p-type Czochralski siliconApplied Physics Letters, 2002
- Interstitial boron and oxygen related defects as the origin of the deep energy level in Czochralski-grown siliconJournal of Applied Physics, 2002
- Aggregation Kinetics of Thermal Double Donors in SiliconPhysical Review Letters, 2001
- Electronic properties of light-induced recombination centers in boron-doped Czochralski siliconJournal of Applied Physics, 1999
- Experimental Evidence of the Oxygen Dimer in SiliconPhysical Review Letters, 1998
- Contactless determination of current–voltage characteristics and minority-carrier lifetimes in semiconductors from quasi-steady-state photoconductance dataApplied Physics Letters, 1996
- Characterization of diffusion length degradation in Czochralski silicon solar cellsApplied Physics Letters, 1996
- Record low surface recombination velocities on 1 Ω cm p-silicon using remote plasma silicon nitride passivationApplied Physics Letters, 1996
- Oxygen diffusion and thermal donor formation in siliconApplied Physics A, 1982