Spectroscopic ellipsometry study of Zn1−xMgxO thin films deposited on Al2O3(0001)
- 7 June 2000
- journal article
- Published by Elsevier BV in Solid State Communications
- Vol. 115 (3), 127-130
- https://doi.org/10.1016/s0038-1098(00)00150-2
Abstract
No abstract availableKeywords
This publication has 12 references indexed in Scilit:
- Refractive indices and absorption coefficients of MgxZn1−xO alloysApplied Physics Letters, 2000
- Optical and structural properties of epitaxial MgxZn1−xO alloysApplied Physics Letters, 1999
- Structure and optical properties of ZnO/Mg0.2Zn0.8O superlatticesApplied Physics Letters, 1999
- Room-temperature ultraviolet laser emission from self-assembled ZnO microcrystallite thin filmsApplied Physics Letters, 1998
- On the optical band gap of zinc oxideJournal of Applied Physics, 1998
- Mg x Zn 1−x O as a II–VI widegap semiconductor alloyApplied Physics Letters, 1998
- Optical Constants of ZnOJapanese Journal of Applied Physics, 1997
- High quality crystalline ZnO buffer layers on sapphire (001) by pulsed laser deposition for III–V nitridesApplied Physics Letters, 1997
- Optically pumped lasing of ZnO at room temperatureApplied Physics Letters, 1997
- Calibration of oxygen Auger signal from single-crystal ZnO surfacesJournal of Vacuum Science & Technology A, 1987