Picosecond electro-optic sampling system

Abstract
We report the construction of a sensitive electro‐optic sampling system for the measurement of ultrafast electrical transients. This system has a temporal resolution of lessthan 4 ps (over 100‐ GHz bandwidth), better than 50‐μV sensitivity and potential for a temporal resolution reaching the single picosecond. Demonstrated applications are ultrafast photodetector response characterization and time resolved photoconductivity.