Advanced surface analysis of silicate glasses, oxides and other insulating materials: a review
- 1 January 1997
- journal article
- review article
- Published by Elsevier BV in Journal of Non-Crystalline Solids
- Vol. 209 (1-2), 1-18
- https://doi.org/10.1016/s0022-3093(96)00556-x
Abstract
No abstract availableThis publication has 101 references indexed in Scilit:
- Quantitative XPS analysis of leached layers on optical glassesSurface and Interface Analysis, 1993
- An “omega” energy filtering TEM— Principles and applicationsAdvanced Materials, 1993
- Charakterisierung keramischer Werkstoffe mit der Auger-Elektronenspektroskopie: Möglichkeiten und GrenzenMaterialwissenschaft und Werkstofftechnik, 1990
- High spatial resolution auger electron spectroscopy and x-ray photoelectron spectroscopyTrAC Trends in Analytical Chemistry, 1989
- Reduction of charging in surface analysis of insulating materials by AESSurface and Interface Analysis, 1989
- Ion bombardment effects on the near‐surface composition during sputter profilingSurface and Interface Analysis, 1988
- SNMS-analysis of insulatorsMicrochimica Acta, 1987
- On the role of Gibbsian segregation in causing preferential sputteringSurface and Interface Analysis, 1985
- Phase changes in insulators produced by particle bombardmentNuclear Instruments and Methods, 1981
- Elektronenmikroskopische Untersuchung von Transversalschnitten dünner Schichten auf festen UnterlagenThe European Physical Journal A, 1969