Bias of amplitude estimation using three-parameter sine fitting in the presence of additive noise
- 30 June 2009
- journal article
- Published by Elsevier BV in Measurement
- Vol. 42 (5), 748-756
- https://doi.org/10.1016/j.measurement.2008.12.006
Abstract
No abstract availableKeywords
This publication has 17 references indexed in Scilit:
- Robust Sine Wave Fitting in ADC Testing2007 IEEE Instrumentation & Measurement Technology Conference IMTC 2007, 2006
- Improved Determination of the Best Fitting Sine Wave in ADC TestingIEEE Transactions on Instrumentation and Measurement, 2005
- Mobile Robot Visual Navigation Using Multiple FeaturesEURASIP Journal on Advances in Signal Processing, 2005
- On the Rotation Period of (90377) SednaThe Astrophysical Journal, 2005
- Spatial Distribution of Gravity-Dependent Gain Changes in the Vestibuloocular ReflexJournal of Neurophysiology, 2005
- Low frequency impedance measurement using sine-fittingMeasurement, 2004
- Measurement of retardation in digital photoelasticity by load stepping using a sinusoidal least-squares fittingOptics and Lasers in Engineering, 2004
- New methods to improve convergence of sine fitting algorithmsComputer Standards & Interfaces, 2003
- Fast and accurate ADC testing via an enhanced sine wave fitting algorithmIEEE Transactions on Instrumentation and Measurement, 1997
- An improved sine-wave fitting procedure for characterizing data acquisition channelsIEEE Transactions on Instrumentation and Measurement, 1996