Design of double- and triple-sampling X-bar control charts using genetic algorithms

Abstract

As today's manufacturing firms are moving towards agile manufacturing, quick and economic on-line statistical process control solutions are in high demand. Multiple sampling X-bar control charts are such an alternative. They can be designed to allow quick detection of a small shift in process mean and provide a quick response in an agile manufacturing environment. In this paper, the designs of double-sampling (DS) X-bar control charts are formulated and solved with a genetic algorithm. Based on the results in solving the DS chart design problems, triple sampling (TS) X-bar control charts are developed. The efficiency of the TS charts is compared with that of the DS charts. The results of the comparison show that TS charts are more efficient in terms of minimizing the average sample size.