High brightness GaN LEDs degradation during dc and pulsed stress
- 23 August 2006
- journal article
- Published by Elsevier BV in Microelectronics Reliability
- Vol. 46 (9-11), 1720-1724
- https://doi.org/10.1016/j.microrel.2006.07.050
Abstract
No abstract availableKeywords
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