A compact, reliable scanning tunneling microscope (STM) is described which provides atomic scale resolution and is intended for surface science studies. The novel design features consist of a rigid contact between the sample and piezoelectric scanner, together with the use of a pivot and lever arm to achieve both coarse and fine mechanical motion. Topological images of the Si(111) 7×7 surface are presented showing some point and extended defects. The bias dependence of these topographs is demonstrated and briefly discussed.