Angle-resolved XPS and AES: Depth-resolution limits and a general comparison of properties of depth-profile reconstruction methods
- 1 May 1995
- journal article
- Published by Elsevier BV in Journal of Electron Spectroscopy and Related Phenomena
- Vol. 73 (1), 25-52
- https://doi.org/10.1016/0368-2048(94)02270-4
Abstract
No abstract availableKeywords
This publication has 54 references indexed in Scilit:
- Simple method of depth profiling (stratifying) contamination layers, illustrated by studies on stainless steelSurface and Interface Analysis, 1994
- The angle-resolved self-ratio technique for surface depth profile investigations by XFS, EMA, XPS and AESMicrochimica Acta, 1992
- Photoelectron holography = holography + photoelectron diffractionJournal of Electron Spectroscopy and Related Phenomena, 1990
- Quantitative analysis of the inelastic background in surface electron spectroscopySurface and Interface Analysis, 1988
- Uniformity quantification of lubricant layer on magnetic recording mediaIEEE Transactions on Magnetics, 1987
- Maximum entropy analysis of quasielastic light scattering from colloidal dispersionsThe Journal of Chemical Physics, 1986
- Quantitative XPS: The calibration of spectrometer intensity—energy response functions. 1—The establishment of reference procedures and instrument behaviourSurface and Interface Analysis, 1984
- A review of the analysis of surfaces and thin films by AES and XPSVacuum, 1984
- Modification of the Beer–Lambert equation for application to concentration gradientsSurface and Interface Analysis, 1981
- High-Resolution X-Ray Photoemission Spectrum of the Valence Bands of GoldPhysical Review B, 1972