Experimental evidence for a Coulomb gap in two dimensions
- 15 September 1995
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review B
- Vol. 52 (11), 7857-7859
- https://doi.org/10.1103/physrevb.52.7857
Abstract
We have studied the resistivity of a two-dimensional electron system in silicon in the temperature range 200 mK Texp[(/T] for at least four orders of magnitude up to 3× Ω. This behavior is consistent with the existence of a Coulomb gap. Near the metal/insulator transition, the prefactor was found to be ≊h/, and resistivity scales with temperature. For very low electron densities , the prefactor diminishes with diminishing . A comparison with the theory shows that a specific set of conditions is necessary to observe the behavior of resistivity consistent with the existence of the Coulolmb gap.
Keywords
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