The analysis of homogeneously and inhomogeneously anisotropic microstructures by X-ray diffraction
- 1 December 2005
- journal article
- Published by Cambridge University Press (CUP) in Powder Diffraction
- Vol. 20 (4), 376-392
- https://doi.org/10.1154/1.2138066
Abstract
The microstructure of materials is generally, macroscopically, anisotropic and/or inhomogeneous. Traditional diffraction analyses do not take into account this anisotropy and/or inhomogeneity of microstructural features. Thus obtained results can be incomplete, ambiguous, or even erroneous. In this work instrumental requirements (application of parallel beam diffractometers with X-ray lenses or X-ray mirrors and parallel-plate collimators in the laboratory and at synchrotron beam lines) and methodological approaches for the diffraction analysis of anisotropic and inhomogeneous microstructures have been discussed and have been illustrated on the basis of two experimental examples: analysis of the anisotropic nature of the structural imperfection of a sputterdeposited Ti3Al layer and analysis of the anisotropic and inhomogeneous elastic grain interaction in a sputter-deposited Ni layer.Keywords
This publication has 45 references indexed in Scilit:
- Stress, texture, and microstructure in niobium thin films sputter deposited onto amorphous substratesJournal of Applied Physics, 2004
- New Principles of the Substructure Development in Metal Materials under Plastic Deformation, Revealed by Advanced X-Ray MethodsMaterials Science Forum, 2004
- Distributions of Domain Size, Lattice Distortion and Dislocation Density in Tubes of Zr-Based Alloys Studied by a Method Combining X-Ray Line Profile Analysis with Texture MeasurementsMaterials Science Forum, 2004
- Diffraction Measurements of Residual Macrostress and Microstress Using X-Rays, Synchrotron and NeutronsJSME International Journal Series A, 2004
- Determination of steep stress gradients by X-ray diffraction — results of a joint investigationMaterials Science and Engineering: A, 2001
- Elastic constants and their temperature dependence for the intermetallic compound Ti3AlPhilosophical Magazine A, 1996
- Investigation of Inhomogeneous Textures of Coatings and Near-Surface-LayersMaterials Science Forum, 1994
- Intrinsic stress in sputter-deposited thin filmsCritical Reviews in Solid State and Materials Sciences, 1992
- Measurement of stress in nickel oxide layers by diffraction of synchrotron radiationJournal of Materials Science, 1991
- Profile Analysis for Microcrystalline Properties by the Fourier and Other MethodsAustralian Journal of Physics, 1988